Thought patterns of students with a positive or negative self-evaluation bias of competence - Université Paris 8 Vincennes - Saint-Denis
Conference Poster Year : 2023

Thought patterns of students with a positive or negative self-evaluation bias of competence

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hal-04342756 , version 1 (13-12-2023)

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  • HAL Id : hal-04342756 , version 1

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Anne-Laure de Place, Laurent Lima, Fanny Verkampt, Pascal Pansu. Thought patterns of students with a positive or negative self-evaluation bias of competence. Biennial EARLI Conference, Aug 2023, Thessalokini, Greece. ⟨hal-04342756⟩
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