Ion Migration and Space‐Charge Zones in Metal Halide Perovskites Through Short‐Circuit Transient Current and Numerical Simulations - Institut National de l'Energie Solaire Accéder directement au contenu
Article Dans Une Revue Advanced Electronic Materials Année : 2024

Ion Migration and Space‐Charge Zones in Metal Halide Perovskites Through Short‐Circuit Transient Current and Numerical Simulations

Thibault Lemercier
Julien Zaccaro
Lluis Marsal
Osbel Almora

Résumé

The inherent ion migration in metal halide perovskite materials is known to induce deleterious and highly unstable dark currents in X‐ and γ ‐ray detectors based on those compounds upon bias application. Dark current slow drift with time is identified as one of the major drawbacks for these devices to satisfy industrial requirements. Because dark current establishes the detectability limit, current evolution, and eventual growth may mask photocurrent signals produced by incoming X‐ray photons. Relevant information for detector assessment is ion‐related parameters such as ion concentration, ion mobility, and ionic space‐charge zones that are eventually built near the outer contacts upon detector biasing. A combined experimental (simple measurement of dark current transients) and 1D numerical simulation method is followed here using single‐crystal and microcrystalline millimeter‐thick methylammonium‐lead bromide that allows extracting ion mobility within the range of µ$_{ion}$ ≈ 10$^{−7}$ cm$^2$ V$^{−1}$ s$^{−1}$ , while ion concentration values approximate N$_{ion}$ ≈ 10$^{15}$ cm$^{−3}$ , depending on the perovskite crystallinity.
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Dates et versions

hal-04619767 , version 1 (24-06-2024)

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Agustin Alvarez, Marisé García-Batlle, Ferdinand Lédée, Eric Gros-Daillon, Javier Mayén Guillén, et al.. Ion Migration and Space‐Charge Zones in Metal Halide Perovskites Through Short‐Circuit Transient Current and Numerical Simulations. Advanced Electronic Materials, 2024, pp.2400241. ⟨10.1002/aelm.202400241⟩. ⟨hal-04619767⟩
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