Near-field to far-field characterization of speckle patterns generated by disordered nanomaterials - Nanostructures et optique Accéder directement au contenu
Article Dans Une Revue Optics Express Année : 2016

Near-field to far-field characterization of speckle patterns generated by disordered nanomaterials

Résumé

We study the intensity spatial correlation function of optical speckle patterns above a disordered dielectric medium in the multiple scattering regime. The intensity distributions are recorded by scanning near-field optical microscopy (SNOM) with sub-wavelength spatial resolution at variable distances from the surface in a range which spans continuously from the near-field (distance ≪λ) to the far-field regime (distance ≫λ). The non-universal behavior at sub-wavelength distances reveals the connection between the near-field speckle pattern and the internal structure of the medium.
Fichier principal
Vignette du fichier
1601.01481.pdf (3.84 Mo) Télécharger le fichier
Origine Publication financée par une institution

Dates et versions

hal-01310732 , version 1 (16-03-2024)

Identifiants

Citer

Valentina Parigi, Elodie Perros, Guillaume Binard, Céline Bourdillon, Agnès Maître, et al.. Near-field to far-field characterization of speckle patterns generated by disordered nanomaterials. Optics Express, 2016, 24 (7), pp.7019-7027. ⟨10.1364/OE.24.007019⟩. ⟨hal-01310732⟩
161 Consultations
4 Téléchargements

Altmetric

Partager

Gmail Mastodon Facebook X LinkedIn More